Low-Frequency Noise Characterization of AlGaAs/GaAs HBT’s

Borgarino, M. ; Peroni, M. ; Cetronio, A. ; Fantini, F. (2002) Low-Frequency Noise Characterization of AlGaAs/GaAs HBT’s. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

In the present paper we evaluated the fabrication process of AlGaAs/GaAs Heterojunction Bipolar Transistors (HBT’s) by means of low frequency noise characterizations carried out in the 100Hz-100kHz frequency range. We investigated the spectra of the base current fluctuations. The obtained results are compared with the data reported in the literature. The fabrication technology and the experimental set-up are briefly described.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Borgarino, M.
Peroni, M.
Cetronio, A.
Fantini, F.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:36
URI

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