Verification of a frequency dispersion modelin the performance of a GaAs pHEMT travelling-wave MMIC

Kallfass, I. ; Zhang, C. ; Grunenputt, J. ; Teyssandier, C. ; Schumacher, H. (2005) Verification of a frequency dispersion modelin the performance of a GaAs pHEMT travelling-wave MMIC. In: Gallium Arsenide applications symposium. GAAS 2005, 3-7 ottobre 2005, Parigi.
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Abstract

The impact of frequency dispersive effects on typical figures of merit is investigated in a distributed MMIC realized in 0.15µm GaAs pHEMT technology. A novel compact dispersion model, allowing for accurate simulation of both static and dynamic multiple time constant IV characteristics, is employed. In a comparison of measurement and simulation, the model is both validated and used to quantify and interpret the error introduced when neglecting frequency dispersion in the design of MMICs. Device operation is investigated with respect to gain, linearity and power-added efficiency,all of them affected by dispersion effects. The model is shown to significantly improve simulation accuracy by increasing the validity range in terms of the frequency-and voltage regimes.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Kallfass, I.
Zhang, C.
Grunenputt, J.
Teyssandier, C.
Schumacher, H.
Settori scientifico-disciplinari
DOI
Data di deposito
15 Feb 2006
Ultima modifica
17 Feb 2016 14:23
URI

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