Dynamic, self consistent electro-thermal simulation of power microwave devices including the effect of surface metallizations

Cappelluti, F. ; Bonani, F. ; Donati Guerrieri, S. ; Ghione, G. ; Naldi, C.U. ; Pirola, M. (2002) Dynamic, self consistent electro-thermal simulation of power microwave devices including the effect of surface metallizations. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

We present an efficient simulation technique to account for the thermal spreading effects of surface metallizations in the self-consistent dynamic electro-thermal analysis of power microwave devices. Electro-thermal self-consistency is achieved by solving the coupled nonlinear system made of a temperature dependent device electrical model, and of an approximate description of the device thermal behavior through a thermal impedance matrix. The numerical solution is pursued in the frequency domain by the Harmonic Balance technique. The approach is applied to the thermal stability analysis of power AlGaAs/GaAs HBTs and the results show that metallizations have a significant impact on the occurrence of the device thermal collapse.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Cappelluti, F.
Bonani, F.
Donati Guerrieri, S.
Ghione, G.
Naldi, C.U.
Pirola, M.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:38
URI

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