Harmonic Distortion Characterization of SOI MOSFETs

Parvais, B. ; Cerderia, A. ; Schreurs, D. ; Raskin, J.-P. (2003) Harmonic Distortion Characterization of SOI MOSFETs. In: Gallium Arsenide applications symposium. GAAS 2003, 6-10 October 2003, Munich.
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Abstract

Harmonic Distortion (HD) of Partially and Fully Depleted Silicon-on-Insulator nMOSFETs is investigated through DC and Radio-Frequency (RF) characterization methods. Those techniques are compared and it demonstrates that in saturation, HD is dominated by the DC current-voltage characteristics and that the output conductance has to be taken into account. Accurate evaluation of HD at RF requires further measurements.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Parvais, B.
Cerderia, A.
Schreurs, D.
Raskin, J.-P.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:53
URI

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