Recent advances in the measurement and black-box modelling of high-frequency components

Verspecht, Jan ; Schreurs, Dominique (1999) Recent advances in the measurement and black-box modelling of high-frequency components. In: Gallium Arsenide Applications Symposium. GAAS 1999, 4-5 October 1999, Bologna, Italy.
Full text disponibile come:
[thumbnail of GAAS_99_077.pdf]
Anteprima
Documento PDF
Download (2MB) | Anteprima

Abstract

This paper gives an overview of recently developed frequency domain measurement and modelling techniques for non-linear microwave components. The system architecture and measurement capabilities of the Hewlett-Packard "Non-linear Network Measurement System" are described. Three modelling techniques, based on the new instrument measurement data, are discussed: empirical models, state-space models and black-box frequency domain models.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Verspecht, Jan
Schreurs, Dominique
Settori scientifico-disciplinari
DOI
Data di deposito
15 Feb 2006
Ultima modifica
17 Feb 2016 14:29
URI

Altri metadati

Statistica sui download

Statistica sui download

Gestione del documento: Visualizza il documento

^