Abstract

We present mixed-domain, multi-simulator approaches to device modeling and yield-driven optimization. Intelligent computational interfaces combine and enhance the features of otherwise disjoint simulators. Time-domain, frequency-domain and electromagnetic simulations are integrated for efficient statistical modeling and design with mixed-domain specifications. Our approach is demonstrated by statistical modeling of GaAs MESFETs and yield optimization using, simultaneously, SPICE device models, Sonnet's electromagnetic simulator em and OSA's design optimization system OSA90/hope. Space Mapping optimization aligns mode-matching and finite element based electromagnetic simulations.