A new method for MMIC parametric yield realistic evaluations

Bastida, E.M. ; Pagani, Maurizio (1992) A new method for MMIC parametric yield realistic evaluations. In: Gallium Arsenide Applications Symposium. GAAS 1992, 27-29 April 1992, Noordwijk, The Netherlands.
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Abstract

The paper first reports some new results recently obtained at Alcatel-Telettra on the functional yield calculation for large MMICs.The parametric yield evaluation tools usually available for foundry customers are then critically discussed.Subsequently, a very wide and self consistent data base on the MMIC MESFET statistical behaviour is described. Finally, a semiempirical MESFET model is analyzed,which allows accurate forecasts of the MMIC parametric yield by using such data base.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Bastida, E.M.
Pagani, Maurizio
Settori scientifico-disciplinari
DOI
Data di deposito
17 Feb 2006
Ultima modifica
17 Feb 2016 14:45
URI

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