A new technique for thermal resistance measurement in power electron devices

Filicori, Fabio ; Rinaldi, Paola ; Vannini, Giorgio ; Santarelli, Alberto (2005) A new technique for thermal resistance measurement in power electron devices. IEEE Transactions on Instrumentation and Measurement, 54 (5). pp. 1921-1925. ISSN 0018-9456
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Abstract

A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.

Abstract
Document type
Article
Creators
CreatorsAffiliationORCID
Filicori, Fabio
Rinaldi, Paola
Vannini, Giorgio
Santarelli, Alberto
Keywords
device characterization, electron device, power semiconductor devices, semiconductor device testing, thermal resistance measurement
Subjects
ISSN
0018-9456
DOI
Deposit date
28 Mar 2006
Last modified
31 Oct 2012 11:36
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