A new technique for thermal resistance measurement in power electron devices

Filicori, Fabio ; Rinaldi, Paola ; Vannini, Giorgio ; Santarelli, Alberto (2005) A new technique for thermal resistance measurement in power electron devices. IEEE Transactions on Instrumentation and Measurement, 54 (5). pp. 1921-1925. ISSN 0018-9456
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Abstract

A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.

Abstract
Tipologia del documento
Articolo
Autori
AutoreAffiliazioneORCID
Filicori, Fabio
Rinaldi, Paola
Vannini, Giorgio
Santarelli, Alberto
Parole chiave
device characterization, electron device, power semiconductor devices, semiconductor device testing, thermal resistance measurement
Settori scientifico-disciplinari
ISSN
0018-9456
DOI
Data di deposito
28 Mar 2006
Ultima modifica
31 Ott 2012 11:36
URI

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