A computationally efficient unified approach to the numerical analysis of the sensitivity and noise of semiconductor devices

Ghione, G. ; Filicori, F. (1993) A computationally efficient unified approach to the numerical analysis of the sensitivity and noise of semiconductor devices. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 12 (3). pp. 425-438. ISSN 0278-0070
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Abstract

The authors present a computationally efficient unified approach to the numerical simulation of sensitivity and noise in majority-carrier semiconductor devices that is based on the extension to device simulation of the adjoint method for sensitivity and noise analysis of electrical networks. Sensitivity and device noise analysis based on physical models are shown to have a common background, since they amount to evaluating the small-signal device response to an impressed, distributed current source. This problem is addressed by means of a Green's function technique akin to Shockley's impedance field method. To allow the efficient numerical evaluation of the Green's function within the framework of a discretized physical model, inter-reciprocity concepts, based on the introduction of an adjoint device, are exploited. Examples of implementation involving GaAs MESFETs are discussed

Abstract
Tipologia del documento
Articolo
Autori
AutoreAffiliazioneORCID
Ghione, G.
Filicori, F.
Parole chiave
Green's function methods, semiconductor device models, semiconductor device noise, sensitivity, simulation
Settori scientifico-disciplinari
ISSN
0278-0070
DOI
Data di deposito
29 Mar 2006
Ultima modifica
31 Ott 2012 11:46
URI

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