Physics-based electron device modelling and computer-aided MMIC design

Filicori, F. ; Ghione, G. ; Naldi, C.U. (1992) Physics-based electron device modelling and computer-aided MMIC design. IEEE Transactions on Microwave Theory and Techniques, 40 (7). pp. 1333-1352. ISSN 0018-9480
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Abstract

On overview on the state of the art and future trends in physics-based electron device modelling for the computer-aided design of monolithic microwave ICs is provided. After a review of the main physics-based approaches to microwave modeling, special emphasis is placed on innovative developments relevant to circuit-oriented device performance assessment, such as efficient physics-based noise and parametric sensitivity analysis. The use of state-of-the-art physics-based analytical or numerical models for circuit analysis is discussed, with particular attention to the role of intermediate behavioral models in linking multidimensional device simulators with circuit analysis tools. Finally, the model requirements for yield-driven MMIC design are discussed, with the aim of pointing out the advantages of physics-based statistical device modeling; the possible use of computationally efficient approaches based on device sensitivity analysis for yield optimization is also considered

Abstract
Document type
Article
Creators
CreatorsAffiliationORCID
Filicori, F.
Ghione, G.
Naldi, C.U.
Keywords
MMIC, circuit CAD, circuit analysis computing, electron device noise, equivalent circuits, reviews, semiconductor device models, sensitivity analysis, solid-state microwave devices
Subjects
ISSN
0018-9480
DOI
Deposit date
07 Apr 2006
Last modified
31 Oct 2012 11:47
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