Abstract

In this paper an automated laboratory set-up for the characterization of micro- and millimeter-wave electron devices under DC, small- and large-signal operation is described, which is based on a generalized, technology-independent bias system. The biasing parameters adopted, which are a linear combination between currents and voltages at the device ports, allow for a complete characterization of the desired empirical data (e.g. multi-frequency S-matrix) throughout all the regions in which the quiescent operation of the device can be conventionally divided, without any need for the switch between different biasing strategies. The look-up tables of experimental data obtained, which are carried out homogeneously with respect to the same couple of bias parameters, independently of the quiescent regions investigated, are particularly suitable for the characterization of empirical non-linear dynamic models for the electron device.