A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHZ

Kantanen, M. ; Lahdes, M. ; Tuovinen, J. ; Vähä-Heikkilä, T. ; Kangaslahti, P. ; Jukkala, P. ; Hughes, N. (2001) A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHZ. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.

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Abstract

A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.

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