Abstract

This paper presents a set-up which enables the generation and the calibrated time domain measurements of complex envelopes of modulated signals at both ports of non linear microwave power amplifiers. The architecture of the characterization tool is given. Examples of error corrected time domain envelopes at the input / output RF ports of a 36 dBm output power – 30dB power gain L-band SSPA are shown. Futhermore, the use of this characterization tool and a suitable processing of measurement data are applied to a novel measurement based behavioral modeling approach of non linear devices accounting for memory effects.