Design Centering and Yield Optimisation of MMIC’s with Off-Chip Digital Controllers

Centurelli, F. ; Luzzi, R. ; Scotti, G. ; Tommasino, P. ; Trifiletti, A. (2002) Design Centering and Yield Optimisation of MMIC’s with Off-Chip Digital Controllers. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

In this paper, a new methodology to perform yield-oriented design of MMIC’s in III-V technologies is proposed. A digital control of MMIC bias, based on process parameters estimation by on-chip auxiliary circuits, allows yield enhancement. The design centering approach and a distance-dependent correlated statistical model of HEMT devices are used to design the external controller. The design of a MMIC for optical digital systems has highlighted significant yield improvement with respect to previously proposed methodologies

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Centurelli, F.
Luzzi, R.
Scotti, G.
Tommasino, P.
Trifiletti, A.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:36
URI

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