Abstract

In this paper, a new methodology to perform yield-oriented design of MMIC’s in III-V technologies is proposed. A digital control of MMIC bias, based on process parameters estimation by on-chip auxiliary circuits, allows yield enhancement. The design centering approach and a distance-dependent correlated statistical model of HEMT devices are used to design the external controller. The design of a MMIC for optical digital systems has highlighted significant yield improvement with respect to previously proposed methodologies