An Original Methodology to Assess Fatigue Behavior in RF MEMS Devices

Millet, O. ; Bertrand, P. ; Legrand, B. ; Collard, D. ; Buchaillot, L. (2004) An Original Methodology to Assess Fatigue Behavior in RF MEMS Devices. In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.
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Abstract

The analysis of fatigue behavior for polycrystalline gold microbridges is the aim of this paper. A description of the fatigue phenomenon for these elementary structures is presented. It is obtained by combining elementary in situ test benches of varying dimensions and cyclic actuation; in the same way, the debugging-time is determined according to the design. Test benches have been developed allowing performing bending fatigue tests of polycrystalline gold structural layers, describing the fatigue phenomenon and obtaining a constant debugging-time, whatever the excitation frequency and the beams length.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Millet, O.
Bertrand, P.
Legrand, B.
Collard, D.
Buchaillot, L.
Subjects
DOI
Deposit date
16 Jun 2005
Last modified
17 Feb 2016 14:16
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