Noise, Large-Signal Modeling and Characterization of InP/InGaAs HBTs

Lal, N. ; Nuttinck, S. ; Raghavan, A. ; Gebara, E. ; Venkataraman, S. ; Papapolymerou, J. ; Laskar, J. (2002) Noise, Large-Signal Modeling and Characterization of InP/InGaAs HBTs. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

We developed a robust large-signal model for InP/InGaAs HBTs. DC, small-signal, noise and power characteristics of InP/InGaAs HBTs are measured over a wide range of frequencies and bias conditions. A minimum noise figure (FMIN) of 3.5dB, and a gain of 16.8dB are achieved at 10-GHz. These measurement results are the basis for robust nonlinear models of InP/InGaAs HBT devices.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Lal, N.
Nuttinck, S.
Raghavan, A.
Gebara, E.
Venkataraman, S.
Papapolymerou, J.
Laskar, J.
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:36
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