Ziaei, Afshin ; Dean, Thierry ; Mancuso, Yves
(2005)
Lifetime characterization of capacitive power RF MEMS switches.
In: Gallium Arsenide applications symposium. GAAS 2005, 3-7 ottobre 2005, Parigi.
Full text available as:
Abstract
RF MEMS switches provide a low-cost,high performance solution to many RF/microwaveapplications and these switches will be importantbuilding blocks for designing phase shifters, switchedfilters and reflector array antennas for military andcommercial markets.In this paper, progress in characterizing of THALEScapacitive MEMS devices under high RF power ispresented. The design, fabrication and testing ofcapacitive RF MEMS switches for microwave/mm- waveapplications on high-resistivity silicon substrate ispresented .The switches tested demonstrated powerhandling capabilities of 1W (30 dbm) for continuous RFpower. The reliability of these switches was tested atvarious power levels indicating that under continuousRF power. In addition a description of the powerfailures and their associated operating conditions ispresentedThe PC-based test stations to cycle switches and measurelifetime under DC and RF loads have been developed.Best-case lifetimes of 1010 cycles have been achieved inseveral switches from different lots under 30 dbm RFpower.
Abstract
RF MEMS switches provide a low-cost,high performance solution to many RF/microwaveapplications and these switches will be importantbuilding blocks for designing phase shifters, switchedfilters and reflector array antennas for military andcommercial markets.In this paper, progress in characterizing of THALEScapacitive MEMS devices under high RF power ispresented. The design, fabrication and testing ofcapacitive RF MEMS switches for microwave/mm- waveapplications on high-resistivity silicon substrate ispresented .The switches tested demonstrated powerhandling capabilities of 1W (30 dbm) for continuous RFpower. The reliability of these switches was tested atvarious power levels indicating that under continuousRF power. In addition a description of the powerfailures and their associated operating conditions ispresentedThe PC-based test stations to cycle switches and measurelifetime under DC and RF loads have been developed.Best-case lifetimes of 1010 cycles have been achieved inseveral switches from different lots under 30 dbm RFpower.
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
01 Dec 2005
Last modified
17 Feb 2016 14:17
URI
Other metadata
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
01 Dec 2005
Last modified
17 Feb 2016 14:17
URI
Downloads
Downloads
Staff only: