Donati Guerrieri, S. ; Bonani, F. ; Pirola, M. ; Ghione, G. ; Filicori, F.
(1997)
A novel approach to yield estimate and IMP performance optimization of microwave devices.
In: Gallium Arsenide Applications Symposium. GAAS 1997, 3-5 September 1997, Bologna, Italy.
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Abstract
This paper presents an efficient, physics-based approach to evaluate the large-signal (LS) parametric sensitivity of microwave devices operated in (quasi) periodic conditions. The approach is based on the combined use of a two-dimensional drift-diffusion physical model and of an intermediate circuit-oriented large-signal model. The LS parametric sensitivity is then exploited to optimize the doping profile of a GaAs MESFET so as to minimize the third-order intermodulation products (IMP) in a simple large-signal amplifier. An example of yield-oriented statistical analysis of device performances with respect to random variations of technological parameters is also presented.
Abstract