Mixed-domain multi-simulator statistical device modeling and yiel-driven design

Bandler, J.W. ; Biernacki, R.M. ; Chen, S.H. (1997) Mixed-domain multi-simulator statistical device modeling and yiel-driven design. In: Gallium Arsenide Applications Symposium. GAAS 1997, 3-5 September 1997, Bologna, Italy.
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Abstract

We present mixed-domain, multi-simulator approaches to device modeling and yield-driven optimization. Intelligent computational interfaces combine and enhance the features of otherwise disjoint simulators. Time-domain, frequency-domain and electromagnetic simulations are integrated for efficient statistical modeling and design with mixed-domain specifications. Our approach is demonstrated by statistical modeling of GaAs MESFETs and yield optimization using, simultaneously, SPICE device models, Sonnet's electromagnetic simulator em and OSA's design optimization system OSA90/hope. Space Mapping optimization aligns mode-matching and finite element based electromagnetic simulations.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Bandler, J.W.
Biernacki, R.M.
Chen, S.H.
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DOI
Deposit date
23 Nov 2005
Last modified
17 Feb 2016 14:21
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