Recent advances in the measurement and black-box modelling of high-frequency components

Verspecht, Jan ; Schreurs, Dominique (1999) Recent advances in the measurement and black-box modelling of high-frequency components. In: Gallium Arsenide Applications Symposium. GAAS 1999, 4-5 October 1999, Bologna, Italy.
Full text available as:
[thumbnail of GAAS_99_077.pdf]
Preview
PDF
Download (2MB) | Preview

Abstract

This paper gives an overview of recently developed frequency domain measurement and modelling techniques for non-linear microwave components. The system architecture and measurement capabilities of the Hewlett-Packard "Non-linear Network Measurement System" are described. Three modelling techniques, based on the new instrument measurement data, are discussed: empirical models, state-space models and black-box frequency domain models.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Verspecht, Jan
Schreurs, Dominique
Subjects
DOI
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:29
URI

Other metadata

Downloads

Downloads

Staff only: View the document

^