Chokshi, Trushal ; Peroulis, Dimitrios
(2005)
Stress-induced failure modes in high-tuning range RF MEMS varactors.
In: Gallium Arsenide applications symposium. GAAS 2005, 3-7 ottobre 2005, Parigi.
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Abstract
In this paper we focus on electromechanical
modeling of high-tuning range MEMS varactors with a focus
on failures caused by residual compressive stress. In
particular, we quantitatively evaluate for the first time a
high-tuning range parallel-plate MEMS varactor in the presence
of residual compressive stress. A 3D model generated
in ANSYS agrees very favorably with the measured
data and explains non-ideal discontinuities in the varactor’s
C − V curve. It is interesting to note that, although the
failures considered in this paper are not encountered in
RF MEMS switches, they become particularly important
in analog MEMS varactors since they directly impact their
effective tuning range.
Abstract
In this paper we focus on electromechanical
modeling of high-tuning range MEMS varactors with a focus
on failures caused by residual compressive stress. In
particular, we quantitatively evaluate for the first time a
high-tuning range parallel-plate MEMS varactor in the presence
of residual compressive stress. A 3D model generated
in ANSYS agrees very favorably with the measured
data and explains non-ideal discontinuities in the varactor’s
C − V curve. It is interesting to note that, although the
failures considered in this paper are not encountered in
RF MEMS switches, they become particularly important
in analog MEMS varactors since they directly impact their
effective tuning range.
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:29
URI
Other metadata
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:29
URI
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