Pisani, U. ; Ferrero, A. ; Madonna, G.L.
(1998)
Load pull techniques for millimetre wave device characterisation.
In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract
Load-pull experimental characterisation of active devices under non linear operation is a well proved technique still used in designing power amplifiers. When applied to the MMIC, this technique shall require special solutions to be extended to on-wafer devices up to millimetre waves. The paper presents an overview on the traditional load pull measurement techniques focusing the attention on millimetre wave application. An example of a fully automatic on-wafer system is described along with the more useful calibration techniques. By means of this test set a very detailed characterisation of devices can be carried out in short time, by setting the loads either at the fundamental or at the harmonic frequencies with independent controls.[Abstract]
Abstract
Load-pull experimental characterisation of active devices under non linear operation is a well proved technique still used in designing power amplifiers. When applied to the MMIC, this technique shall require special solutions to be extended to on-wafer devices up to millimetre waves. The paper presents an overview on the traditional load pull measurement techniques focusing the attention on millimetre wave application. An example of a fully automatic on-wafer system is described along with the more useful calibration techniques. By means of this test set a very detailed characterisation of devices can be carried out in short time, by setting the loads either at the fundamental or at the harmonic frequencies with independent controls.[Abstract]
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DOI
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15 Feb 2006
Last modified
17 Feb 2016 14:31
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Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:31
URI
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