Local self-heating in short gate GaAs PHEMTs

Aniel, F. ; Lepaul, S. ; Peymayeche, L. ; De Lustrac, A. ; Bouillault, F. ; Adde, R. (1996) Local self-heating in short gate GaAs PHEMTs. In: Gallium Arsenide Applications Symposium. GAAS 1996, 5-6 June 1996, Paris, France.
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Abstract

Self heating in ultrashort gate length GaAs Pseudomorphic High Electron Mobility Transistors (PHEMT) is investigated. The experimental results include an original measurement of the average temperature in the gate drain area of the device channel. An original model which accounts for both bidimensional heat transfer and quasi bidimensional energy balance carrier transport is described. Typical simulations in good agreement with the experiments are discussed.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Aniel, F.
Lepaul, S.
Peymayeche, L.
De Lustrac, A.
Bouillault, F.
Adde, R.
Settori scientifico-disciplinari
DOI
Data di deposito
16 Feb 2006
Ultima modifica
17 Feb 2016 14:38
URI

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