Bastida, E.M. ; Pagani, Maurizio
(1992)
A new method for MMIC parametric yield realistic evaluations.
In: Gallium Arsenide Applications Symposium. GAAS 1992, 27-29 April 1992, Noordwijk, The Netherlands.
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Abstract
The paper first reports some new results recently obtained at Alcatel-Telettra on the functional yield calculation for large MMICs.The parametric yield evaluation tools usually available for foundry customers are then critically discussed.Subsequently, a very wide and self consistent data base on the MMIC MESFET statistical behaviour is described. Finally, a semiempirical MESFET model is analyzed,which allows accurate forecasts of the MMIC parametric yield by using such data base.
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