An overview of GaAs MMICs reliability

Magiscrali, F. (1992) An overview of GaAs MMICs reliability. In: Gallium Arsenide Applications Symposium. GAAS 1992, 27-29 April 1992, Noordwijk, The Netherlands.
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Abstract

This work intends to give an overview of the most important reliability issues for GaAs MMICs; in particular, aspects such as reliability procedures and predominant failure mechanisms will be discussed, highlighting the differences with those of discrete FETs; some of the most relevant reliability figures available from the literature will be presented; finally some comments will be given on common reliability programs running in U.S. and Europe for these devices.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Magiscrali, F.
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DOI
Deposit date
17 Feb 2006
Last modified
17 Feb 2016 14:46
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