Bastida, E.M. ; Donzelli, G.P.
(1990)
An experimentally based systematic approach for yield and reliability evaluation in GaAs MMICs.
In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract
After a critical examination of the state, of the art yield and reliability-evaluation tools, the results are reported of a systematic experimental analysis for the MMIC yield evaluation. The possibility is then proved of determining efficient MMIC reliability evaluation rules. Finally, the main features and the results until now obtained will be reported for an experimental reliability program aimed at giving the Telettra designers the relevant data base.
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