Garbo, G. ; Martines, G. ; Sannino, M.
(1990)
Automated test-set for accurate measurements of minimum noise figure of GaAs FETs.
In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract
A new automated method for the determination of input-termination optimum-condition of low noise microwave GaAs FETs is presented. Since the method is fully automated strong reduction of time-consumption is guaranteed; in addition the method is also accurate because all the effects which influences the noise figure measurements are taken into account. It is opinion of the Authors that both the test-set and the relevant software are unique.
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