Filicori, Fabio ; Rinaldi, Paola ; Vannini, Giorgio ; Santarelli, Alberto
(2005)
A new technique for thermal resistance measurement in power electron devices.
IEEE Transactions on Instrumentation and Measurement, 54
(5).
pp. 1921-1925.
ISSN 0018-9456
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Abstract
A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.
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