De Dominicis, M. ; Giannini, F. ; Limiti, E. ; Saggio, G.
(2000)
Novel 4-points input pattern for large band noise measurements.
In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.
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Abstract
Four parameters are necessary for a complete characterization of the noise behavior of a linear device.The parameters can be experimentally determined by a minimum set of four equations,which can be obtained by an equal number of synthesized reflection coefficients at the input of the DUT,forming a pattern on the Smith chart.To increase the accuracy in the determination of the noise parameters,it is a common procedure to implement an heavily redundant pattern,with a random selection of more than the strictly necessary four points,so forcing the adoption of an expensive tuner.This paper introduces a novel ad hoc selected 4-points pattern,and demonstrates how it can simplify the measurement system without appreciably affecting the measurement accuracy.The proposed pattern is synthesized by easily realizable transmission lines,and a study has been performed to determine lines characteristics for use in wideband noise measurements.
Abstract
Four parameters are necessary for a complete characterization of the noise behavior of a linear device.The parameters can be experimentally determined by a minimum set of four equations,which can be obtained by an equal number of synthesized reflection coefficients at the input of the DUT,forming a pattern on the Smith chart.To increase the accuracy in the determination of the noise parameters,it is a common procedure to implement an heavily redundant pattern,with a random selection of more than the strictly necessary four points,so forcing the adoption of an expensive tuner.This paper introduces a novel ad hoc selected 4-points pattern,and demonstrates how it can simplify the measurement system without appreciably affecting the measurement accuracy.The proposed pattern is synthesized by easily realizable transmission lines,and a study has been performed to determine lines characteristics for use in wideband noise measurements.
Document type
Conference or Workshop Item
(Poster)
Creators
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:43
URI
Other metadata
Document type
Conference or Workshop Item
(Poster)
Creators
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:43
URI
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