Abstract

A powerful and efficient method based on the leaky mode propagation method and recently applied by the authors to model defect-free optical periodic structures,is used to characterize photonic bandgap structures incorporating multiple defects,having arbitrary shape and dimensions.The importance of the defect-mode characterization in photonic bandgap materials materials is due to the intensive use of defects for light localization to design very promising optical devices.In order to prove the usefulness of the method,design of an optical filters for dense wavelength division multipexing applications,has been carried out by the developed model.