Schreurs, D. ; De Raedt, W. ; Vandersmissen, R. ; Neuhaus, B. ; Beyer, A. ; Nauwelaers, B.
(2001)
Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier.
In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract
We evaluate an oscillator-amplifier MMIC submitted to high-temperature operating life time tests. To relate adequately these results with individual components’ results, it is important to realise that failure mechanisms in non-linear MMICs are governed by the maximally instantaneous voltages/currents and hence that comparisons should be conducted at equal instantaneous conditions.
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