Electro-Thermal modelling of very High power Microwave bipolar Junction transistors

Fagan, Christopher J. ; Snowden, Christopher M. (2001) Electro-Thermal modelling of very High power Microwave bipolar Junction transistors. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract

This paper describes a new approach to accurately characterise very high power, Si BJT, devices capable of delivering powers in excess of 250W, at L band, in a class C amplifier configuration. Conventional modelling approaches are not suitable for large power structures. An alternative electro-thermal, equivalent circuit model, has been constructed using a novel hierarchical approach. The thermal dependence of the device characterisation is removed during the extraction of the electrical circuit and is reinserted, within the model, using a suitably complex thermal network, determined using a fully physical thermal simulator. Theoretical and experimental results are shown for steady state and pulsed amplifier operation.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Fagan, Christopher J.
Snowden, Christopher M.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:35
URI

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