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Magiscrali, F.
(1992)
An overview of GaAs MMICs reliability.
In: Gallium Arsenide Applications Symposium. GAAS 1992, 27-29 April 1992, Noordwijk, The Netherlands.
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Abstract
This work intends to give an overview of the most important reliability issues for GaAs MMICs; in particular, aspects such as reliability procedures and predominant failure mechanisms will be discussed, highlighting the differences with those of discrete FETs; some of the most relevant reliability figures available from the literature will be presented; finally some comments will be given on common reliability programs running in U.S. and Europe for these devices.
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