High performance test fixture for 10-Port MMIC's characterisation

Kamenopolsky, Stanimir ; Dankov, Plamen (2001) High performance test fixture for 10-Port MMIC's characterisation. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract

High-performance measuring multi-port 3-level fixture for active device characterization in the Ku-band is described in this paper. It is a low-cost alternative of the expensive microwave "on-wafer" measurements with CPW probes. The method of modeling of the separate components of the each embedding RF-path of the fixture is used for de-embedding purposes. Testing of several phantom-type structures on the chip-carrier level confirms the ability of the considered fixture to give repeatable results for the extracted own MMIC's parameters: mainly for the insertion phase and the gain.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Kamenopolsky, Stanimir
Dankov, Plamen
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:33
URI

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