High performance test fixture for 10-Port MMIC's characterisation

Kamenopolsky, Stanimir and Dankov, Plamen (2001) High performance test fixture for 10-Port MMIC's characterisation. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
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Abstract

High-performance measuring multi-port 3-level fixture for active device characterization in the Ku-band is described in this paper. It is a low-cost alternative of the expensive microwave "on-wafer" measurements with CPW probes. The method of modeling of the separate components of the each embedding RF-path of the fixture is used for de-embedding purposes. Testing of several phantom-type structures on the chip-carrier level confirms the ability of the considered fixture to give repeatable results for the extracted own MMIC's parameters: mainly for the insertion phase and the gain.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Kamenopolsky, Stanimir
Dankov, Plamen
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:33
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