A Simple Parallel-Plate Resonator Technique for Microwave. Characterization of Thin Resistive Films

Vorobiev, A. ; Deleniv, A. ; Talanov, V. ; Gevorgian, S. (2002) A Simple Parallel-Plate Resonator Technique for Microwave. Characterization of Thin Resistive Films. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

A parallel-plate resonator method is proposed for non-destructive characterisation of resistive films used in microwave integrated circuits. A slot made in one of the plates is used to measure surface impedance of a reference film and film under test. The surface impedance of the film under test is extract from these two measurements using a simple procedure. X-band experimental verification is given for a number of resistive films.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Vorobiev, A.
Deleniv, A.
Talanov, V.
Gevorgian, S.
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:32
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