Statistical techniques for MMIC design sensitivity and chip yield analysis

Marsh, S.P. ; Long, A.P. ; Wadsworth, S.D. (1998) Statistical techniques for MMIC design sensitivity and chip yield analysis. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
Full text disponibile come:
[thumbnail of GAAS_98_098.pdf]
Anteprima
Documento PDF
Download (2MB) | Anteprima

Abstract

This paper describes the first application of Taguchi SDOE to the sensitivity analysis of a MMIC amplifier. The technique demonstrates clearly which of the simulated performance parameters, including the one dB compression point derived from non-linear simulation, are sensitive to which of the device matching elements. The adaptability of the Taguchi technique is also demonstrated by applying it to the tolerance analysis of the same MMIC. Correlation of some of the HEMT parameters is now taken into account by the analysis, and the results are compared to those obtained by a fully correlated database sampling technique.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Marsh, S.P.
Long, A.P.
Wadsworth, S.D.
Settori scientifico-disciplinari
DOI
Data di deposito
16 Feb 2006
Ultima modifica
17 Feb 2016 14:35
URI

Altri metadati

Statistica sui download

Statistica sui download

Gestione del documento: Visualizza il documento

^