Browse the list: Convegni ed altri Eventi

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of documents:1.

Raffo, A. and Santarelli, A. and Traverso, P.A. and Vannini, G. and Filicori, F. (2004) On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices. In: 63rd ARFTG Conference Digest Spring, 2004, 11 giugno 2004, Fort Worth, Texas.

This list has been generated onTue Apr 20 20:39:18 2021 CEST.
^