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Number of documents:1.

Raffo, A. ; Santarelli, A. ; Traverso, P.A. ; Vannini, G. ; Filicori, F. (2004) On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices. In: 63rd ARFTG Conference Digest Spring, 2004, 11 giugno 2004, Fort Worth, Texas.

This list has been generated onThu Apr 18 20:39:12 2019 CEST.
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