Abstract

This paper is a summary of our research in the field of noise in oscillators. An original approach has been developed to check the validity of the theoretical models and also, to investigate some techniques of noise reduction. It is based on open loop (or residual) phase noise measurements of microwave transistors. It allows us to identify the different noise sources contributing to the phase noise in a high frequency oscillator. The oscillator phase noise can then be simulated and optimised.