Saunier, Paul
(2004)
GaN Technology Overview: Accomplishments
and Challenges.
In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.
Full text disponibile come:
Abstract
This paper reports the (published) status
of the AlGaN/GaN technology in the United States.
Activities can be divided between AlGaN/GaN on
SiC substrates for military applications, sponsored
by DoD and AlGaN/GaN on Si for Base Stations.
No doubt that early emphasis for US DoD has been
“performances” (the W/mm race!) and progress
has been fast, probably culminating with UCSB
and Cree demonstrating 32W/mm at 4 GHz. These
excellent performances have been made possible by
the introduction and refinement of the “Field-
Plate”. Understandably, the emphasis is now
reliability, and all the challenges have not been
conquered. In the commercial world, Nitronex has
been pionneering AlGaN/GaN on Si,
manufacturing large gate width devices using
MOCVD grown 4” Si substrates; 20W at –39dBc is
achieved with 11.5dB gain and 25% pae (28V bias)
over 1.8-2.2GHz. Excellent reliability is extracted
with over 20 years MTTF. TriQuint has
demonstrated the potential of GaN on Si for higher
frequencies with 7W/mm with 38% pae and 9dB
gain at 10GHz.
Abstract
This paper reports the (published) status
of the AlGaN/GaN technology in the United States.
Activities can be divided between AlGaN/GaN on
SiC substrates for military applications, sponsored
by DoD and AlGaN/GaN on Si for Base Stations.
No doubt that early emphasis for US DoD has been
“performances” (the W/mm race!) and progress
has been fast, probably culminating with UCSB
and Cree demonstrating 32W/mm at 4 GHz. These
excellent performances have been made possible by
the introduction and refinement of the “Field-
Plate”. Understandably, the emphasis is now
reliability, and all the challenges have not been
conquered. In the commercial world, Nitronex has
been pionneering AlGaN/GaN on Si,
manufacturing large gate width devices using
MOCVD grown 4” Si substrates; 20W at –39dBc is
achieved with 11.5dB gain and 25% pae (28V bias)
over 1.8-2.2GHz. Excellent reliability is extracted
with over 20 years MTTF. TriQuint has
demonstrated the potential of GaN on Si for higher
frequencies with 7W/mm with 38% pae and 9dB
gain at 10GHz.
Tipologia del documento
Documento relativo ad un convegno o altro evento
(Atto)
Autori
Settori scientifico-disciplinari
DOI
Data di deposito
16 Giu 2005
Ultima modifica
17 Feb 2016 14:16
URI
Altri metadati
Tipologia del documento
Documento relativo ad un convegno o altro evento
(Atto)
Autori
Settori scientifico-disciplinari
DOI
Data di deposito
16 Giu 2005
Ultima modifica
17 Feb 2016 14:16
URI
Statistica sui download
Statistica sui download
Gestione del documento: