FET physics-based, MMIC yield analysis CAD tools and capabilities demonstrated within the EDGE project.

Ladbrooke, P.H. (1999) FET physics-based, MMIC yield analysis CAD tools and capabilities demonstrated within the EDGE project. In: Gallium Arsenide Applications Symposium. GAAS 1999, 4-5 October 1999, Bologna, Italy.
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Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Ladbrooke, P.H.
Subjects
Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
DOI
10.6092/unibo/amsacta/1361
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:26
URI
https://amsacta.unibo.it/id/eprint/1361

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