A measurement system for FET derivative extraction under dynamic operating regime

Peña, R. ; Gómez, C. ; García, J. A. (2005) A measurement system for FET derivative extraction under dynamic operating regime. In: Gallium Arsenide applications symposium. GAAS 2005, 3-7 ottobre 2005, Parigi.
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Abstract

This paper presents a novel measurement system for derivative extraction under dynamic conditions based on the utilization of pulsed signals. This kind of characterization avoids unrealistic heating and trapping effects, making possible to realize the extraction process under conditions as close as possible to the device RF behaviour. The system principles and set-up are presented and described in order to provide reliable device modelling. Moreover, results of the derivative extraction process for an FLL177ME MESFET are presented with the aim of highlighting the existing differences between pulsed and traditional DC derivative characterization.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Peña, R.
Gómez, C.
García, J. A.
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DOI
Deposit date
15 Feb 2006
Last modified
17 Feb 2016 14:27
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