On-wafer millimeter-wave characterization

Marks, Roger B. (1998) On-wafer millimeter-wave characterization. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract

This paper overviews the on-wafer characterization of microelectronic components in the millimeter-wave and microwave regions of the spectrum. This method has proven an invaluable tool in design and manufacturing. The paper reviews the literature in the field and notes some specific considerations required at millimeter-wave frequencies.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Marks, Roger B.
Settori scientifico-disciplinari
Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
DOI
10.6092/unibo/amsacta/1517
Data di deposito
15 Feb 2006
Ultima modifica
17 Feb 2016 14:31
URI
https://amsacta.unibo.it/id/eprint/1517

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