Marks, Roger B.
(1998)
On-wafer millimeter-wave characterization.
In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract
This paper overviews the on-wafer characterization of microelectronic components in the millimeter-wave and microwave regions of the spectrum. This method has proven an invaluable tool in design and manufacturing. The paper reviews the literature in the field and notes some specific considerations required at millimeter-wave frequencies.
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