Measuring, black-box modelling and simulating transistor nonlinear behavior: nonlinear S-parameters can do the job!

Verspecht, Jan ; Van Esch, Patrick (1998) Measuring, black-box modelling and simulating transistor nonlinear behavior: nonlinear S-parameters can do the job! In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract

This paper describes an original way of dealing with the measuring and modelling of microwave transistor nonlinear behavior. Although generalizations are possible, the method described in this particular paper deals with transistor behavior under a large signal one-tone excitation, with arbitrary impedance terminations for the fundamental and the harmonics. First the mathematical theory of the "nonlinear s-parameters " is described. Next the measurement set-up and the actual extraction of the model parameters is highlighted. Finally the model is implemented in a commercial harmonic balance simulator. Using the simulator, model verification is performed by comparing measured and modelled behavior.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Verspecht, Jan
Van Esch, Patrick
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DOI
Deposit date
16 Feb 2006
Last modified
17 Feb 2016 14:31
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