New trends of nonlinear modeling for microwave devices in a circuit/system environment

Barataud, D. ; Campovecchio, M. ; Teyssier, J.P. ; Nebus, J.M. ; Quéré, R. ; Obregon, J. (1998) New trends of nonlinear modeling for microwave devices in a circuit/system environment. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract

Specific pulsed measurement techniques are presented to discriminate thermal and trapping effects during the modeling process. An electrothermal modeling approach, a new trap model and a specific nonlinear distributed topology are proposed. Moreover, a new time domain load-pull set-up has been developed to aid in the nonlinear model validation under one and two-tone excitations.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Barataud, D.
Campovecchio, M.
Teyssier, J.P.
Nebus, J.M.
Quéré, R.
Obregon, J.
Settori scientifico-disciplinari
DOI
Data di deposito
16 Feb 2006
Ultima modifica
17 Feb 2016 14:32
URI

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