New trends of nonlinear modeling for microwave devices in a circuit/system environment

Barataud, D. ; Campovecchio, M. ; Teyssier, J.P. ; Nebus, J.M. ; Quéré, R. ; Obregon, J. (1998) New trends of nonlinear modeling for microwave devices in a circuit/system environment. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract

Specific pulsed measurement techniques are presented to discriminate thermal and trapping effects during the modeling process. An electrothermal modeling approach, a new trap model and a specific nonlinear distributed topology are proposed. Moreover, a new time domain load-pull set-up has been developed to aid in the nonlinear model validation under one and two-tone excitations.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Barataud, D.
Campovecchio, M.
Teyssier, J.P.
Nebus, J.M.
Quéré, R.
Obregon, J.
Subjects
DOI
Deposit date
16 Feb 2006
Last modified
17 Feb 2016 14:32
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