Martín-Guerrero, T.M. ; Esteban-Marzo, J. ; Castillo-Vázquez, B. ; Camacho-Peñalosa, C.
(2002)
A single relaxation-time non-quasi-static model for monolithic MESFET devices.
In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
Full text available as:
Abstract
In this contribution a MESFET equivalent circuit that takes into account the device’s non-quasi-static (NQS) effects is presented. The model topology is deduced directly from the small-signal measurement analysis and consists of a small-signal equivalent circuit that can be obtained from the linearization of a non-linear NQS model with non-linear state-functions (terminal charges and currents) that include a single relaxation-time. Results confirm that just one relaxation-time for all components is needed. The proposed model provides small-signal simulation performance similar to conventional models, but incorporating NQS effects in a consistent way and using just a reduced number of non-linear functions.
Abstract
In this contribution a MESFET equivalent circuit that takes into account the device’s non-quasi-static (NQS) effects is presented. The model topology is deduced directly from the small-signal measurement analysis and consists of a small-signal equivalent circuit that can be obtained from the linearization of a non-linear NQS model with non-linear state-functions (terminal charges and currents) that include a single relaxation-time. Results confirm that just one relaxation-time for all components is needed. The proposed model provides small-signal simulation performance similar to conventional models, but incorporating NQS effects in a consistent way and using just a reduced number of non-linear functions.
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:38
URI
Other metadata
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:38
URI
Downloads
Downloads
Staff only: