Abstract

A new approach to the approximation of nonlinear characteristics for look-up table based electron device models is proposed. It relys on the strong analogy between signal sampling and characteristic measurements over a discrete grid of bias points. On this basis, nonlinear function approximation can be carried out by using approaches similar to well-known techniques for reconstruction of continuous-time signals from a given sequence of samples. With respect to conventional interpolation techniques, the method proposed guarantees the accurate reproduction both of nonlinear characteristics and as­sociated derivatives without non physical slopes or oscillating behaviour. Preliminary simulated and experimental results confirming the effectiveness of this approach are presented.