Abstract

A universal DC and pulsed I-V test set is presented, that allows automated DC-only, pulse-only and DC + pulse measurements on 2 and 3 terminal semiconductor devices, the later ones in 3 selectable common-configurations. Tests can be done on packaged devices and on-wafer; temperature dependency studied and time-depended features like trapping effects in GaN-based HEMTs. Novel is that once the overall test setup is assembled, no external hardware changes are neccesary for a full (automated) characterization of all quadrants of the I-V plot, and that in the pulse mode the V and I sampling point already can be at 8 ns from the leading edge, allowing measurements with very limited average device temperature increase.