On-line noise characterization

Dambrine, G. ; Danneville, F. ; Belquin, J.M. ; Cappy, A. (1994) On-line noise characterization. In: Gallium Arsenide Applications Symposium. GAAS 1994, 28-30 April 1994, Turin, Italy.

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Abstract

A new method for systematic measurements of noise parameters of field effect devices has been developed. This method can be easily implemented with a conventional on-wafer station. Since no tuner is needed, this technique does not require a long time of measurement and it is well suited for in line noise characterization.

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